3 edition of An approach to designing stuck-open testable CMOS combinational circuit found in the catalog.
An approach to designing stuck-open testable CMOS combinational circuit
by State University of New York at Buffalo, Dept. of Computer Science in Buffalo, N.Y
Written in English
|Series||Technical report (State University of New York at Buffalo. Dept. of Computer Science) -- 90-01|
|The Physical Object|
|Number of Pages||29|
The problem of designing easily testable CMOS combinational circuits is afforded. Two CMOS structured design techniques are presented. The novelty of this approach relies upon the complete fault detection of single and multiple line stuck-at, transistor stuck-open and stuck-on faults for combinational by: 2. A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits (JFW, TYK, JYL), pp. – DACBoehner #automation #logic #named LOGEX — an Automatic Logic Extractor Form Transistor to Gate Level for CMOS Technology (MB), pp. –
Praise for CMOS: Circuit Design, Layout, and SimulationRevised Second Edition from the Technical Reviewers "A refreshing industrial flavor. Design concepts are presented as they are needed for 'just-in-time' learning. Simulating and designing circuits using SPICE is emphasized with literally hundreds of examples. Very few textbooks contain as much detail as this one.5/5(4). An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science.
This book is a long overdue explanation of the "Logical Effort" approach to MOS circuit design invented by two of the authors, Sutherland and Sproull, in the late 80's. The technique presented is complete and powerful, and this book should be required reading for all persons involved in high-performance or low-power MOS digital by: Going beyond the design of simple combinational and sequential modules, it shows how such modules are used to build complete systems, reflecting real-world digital design. All the essential topics are covered, including design and analysis of combinational and sequential modules, as well as system timing and synchronization.
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An integrated approach to the design of combinational logic circuits in which all single stuck-open faults and path delay faults are detectable by robust tests was presented by the authors earlier.
This paper considers design of CMOS combinational logic circuits in which all multiple stuck-at, stuck-open and all multiple path delay faults are robustly by: generation very costly. It is also possible that a combinational block may not have any two-pattern robust sequence [41, [ To overcome this problem, testable design schemes have been proposed -.
These schemes employ extra transis- tors in fully CMOS (FCMOS) gates, to augment CMOS circuits for the detection of stuck-open faults.
The design of easily testable CMOS combinational circuits is discussed. Two CMOS structured design techniques are presented. The novelty of this approach is the complete fault detection of single- and multiple-line stuck-at, transistor stuck-open, and stuck-on faults for combinational circuits.
CMOS circuits present severe problems in the detection of transistor stuck-open faults. In CMOS circuits, the transistor stuck-open (s-open) faults cause sequential behavior, and hence two- or.
Testable designs for CMOS devices to detect s-OPEN using a single test vector in the presence of glitches and timing skews were presented in , .
But the stuck-open fault model covers the physical defects not covered by stuck-at fault models. This chapter presents an easily testable CMOS implementation of a combinational circuit based on ESOP expressions for detecting single stuck-open faults. A stuck-open fault in a combinational circuit File Size: KB.
IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 30, NO.8, AUGUST Testable Design of BiCMOS Circuits for Stuck-Open Fault Detection Using Single Patterns Sankaran M.
Menon, Member, IEEE, Yashwant K. Malaiya, Senior An approach to designing stuck-open testable CMOS combinational circuit book, IEEE, Anura P. Jayasumana, Senior Member, IEEE, and Rochit Rajsuman, Senior Member, IEEE Abstract-Single BJT BiCMOS devices exhibit sequential be. The parity testability of a single output is related to its partition in terms of maximal supergates and then a scheme is proposed for making an untestable circuit parity testable by augmenting.
testable reversible sequential circuits design for any stuck-at-fault(S-A-F) by only two test vectors i.e. all 0's and 1's which eliminates the necessitate for any type of scan path access to internal memory cells.
The DET (Double edge triggered) flip-flop reversible design is proposed for the first time in the literature. A simple approach for designing online testable reversible circuits. low power CMOS design , optical computing , nan- number of benchmarks and some combinational logic circuits is.
p>The paper proposes a design strategy to retain the true nature of the output in the event of occurrence of stuck at faults at the interconnect levels of digital circuits. The procedure. However, this is not true for all static CMOS circuits.
In this chapter, procedures for designing robustly testable static CMOS circuits will be discussed. Generally, the circuits are designed to be robustly testable with respect to single stuck-open : Niraj K.
Jha, Sandip Kundu. Design for Testability of Asynchronous VLSI Circuits A thesis submitted to the University of Manchester its corresponding iterative combinational circuit b).
52 Figure Markov chain representing the mechanism of Static asymmetric C-elements testable for stuck-open faults: a) OR-AND type asymmetric C-element; b) AND-OR type. circuit as possible. The proposed approach was tested using benchmarks from the ISCAS 89 suite of circuits.
Experimen-tal results indicate that faul t-excitation, within a reasonable CPU time limit, is possible in most cases. Introduction To review the problem of detecting FET stuck-open faults in CMOS gates, consider the circuit diagram of.
This paper presents a built-in self-test (BIST) scheme for detecting all robustly testable multiple stuck-open faults confined to any single complex cell of a CMOS circuit.
The test pattern generator (TPG) generates all n 2 n single-input-change (SIC) ordered test pairs for an n -input circuit-under-test (CUT) contained in a sequence of length 2 n 2 by: 2. In this article, an automatic test pattern generation technique using neural network models for stuck-open faults in CMOS combinational circuits is presented.
For a gate level fault model of stuck-open faults in CMOS circuits, SR(slow-rise) and SF(slow-fall) gate transition faults we develop a neural network representation. A neural network computation technique for generating robust test Cited by: 8.
A stuck-open fault in a combinational circuit may induce a sequential behaviour in the circuit. Testing of a stuck-open fault requires a two-pattern test, consisting of an initialization and a test vector.
Owing to the presence of arbitrary delays in the circuits, a two-pattern test may be invalidated. Single Stuck-at-Value Faults Single s-a-v: single line permanently tied to 0 or 1 zMost commonly used zCan represent many other fault types zRelatively “small” in size Three properties define a single stuck-at fault zOnly one line faulty zFaulty line permanently set to 0 or 1 zFault present at input or output of gate Multiple s-a-v zFor n lines: 3n-1 stuck line combinations vs.
2n inFile Size: KB. The problem of designing easily testable CMOS combinational circuits is afforded. Two CMOS structured design techniques are presented. The novelty of this approach relies upon the complete fault detection of single and multiple line stuck-at, transistor stuck-open and stuck-on faults for combinational circuits.
A design for testability technique and an associated test algorithm are presented for CMOS combinational circuits. It will be shown that stuck-open faults, stuck-on faults, bridging faults and delay faults can all be detected in CMOS combinational circuits using such test procedure.
Previous article in Author: Giacomo Buonanno, Fabrizio Lombardi, Donatella Sciuto, Y.-N. Shen. Abstract. When designing VLSI integrated circuit (IC), the regularity of its structure makes the design process simpler.
Because of this, IC’s with regular architecture like iterative logic arrays (ILA’s) have attracted the attention of scientists during the last by: 1.Effective test pattern generation for CMOS circuits has long been a problem in IC design.
Using a CMOS complex gate design as an example, in this paper we consider fault behaviour, possible test patterns for different types of faults, and a systematic approach to the generation of test patterns covering stuck-at- stuck-open- and most types of bridging by: 6.Additionally, circuit-level modifications supporting testable design of asynchronous CMOS circuits are investigated.
2. CMOS Fault Behavior The static stuck-at fault model as introduced by Eldered  already in the s has been applied successfully to all classes of circuits well into the : H.
T. Vierhaus, W. Meyer, U. Gläser, R. Camposano.